CI003

Higher Defect Reduction vs. Lower Data Collection Burden

Business Context. Reducing defects to Six Sigma levels requires extensive data collection to detect rare occurrences reliably, but the burden of collecting that much data can itself become a significant operational cost.

Process TRIZ Resolution. Rather than collecting exhaustive data on every process step, organizations should focus intensive data collection on the specific steps identified as the primary defect sources, using lighter sampling for steps with historically low defect rates.

Applicable TRIZ Principles

Principle 3 (Local Quality) applies intensive data collection only to steps identified as primary defect sources.

Principle 2 (Taking Out) removes exhaustive data collection from historically low-defect steps.

Principle 26 (Copying) uses representative sampling instead of full data collection where appropriate.

Expected Outcome

Meaningful defect reduction

Lower overall data collection burden

Focused improvement effort

Efficient use of measurement resources

Decision Indicators

Data collection effort is spread evenly regardless of actual defect concentration.

Measurement burden has become a barrier to starting improvement projects.

Low-defect steps receive the same scrutiny as high-defect steps.

No prioritization determines where data collection effort should focus.

Teams abandon defect reduction projects due to data collection cost.

If several of these indicators are present, the contradiction is likely active and the Process TRIZ resolution above should be evaluated.